Title : 
Accurate Timing Analysis using SAT and Pattern-Dependent Delay Models
         
        
            Author : 
Tadesse, D. ; Sheffield, D. ; Lenge, E. ; Bahar, R.I. ; Grodstein, J.
         
        
            Author_Institution : 
Div. of Eng., Brown Univ., Providence, RI
         
        
        
        
        
        
            Abstract : 
Accurate delay modeling beyond static models is critical to garnering better correlation with post-silicon analysis. Furthermore, post-silicon timing validation requires a pattern-dependent timing model to generate patterns. To address these issues, a timing analysis tool was proposed that integrates a data-dependent delay model into its analysis. The approach solves for the delay by using the concept of circuit unrolling and formulation of timing questions as decision problems for input into a SAT solver. The effectiveness and validity of the proposed methodology is illustrated through experiments on benchmark circuits
         
        
            Keywords : 
delays; integrated circuit modelling; integrated circuit testing; logic CAD; timing; SAT solver; circuit unrolling; delay modeling; pattern-dependent delay models; post-silicon analysis; timing analysis tool; timing questions; Circuit faults; Circuit testing; Crosstalk; Delay effects; Delay estimation; Logic; Pattern analysis; Silicon; Test pattern generators; Timing;
         
        
        
        
            Conference_Titel : 
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
         
        
            Conference_Location : 
Nice
         
        
            Print_ISBN : 
978-3-9810801-2-4
         
        
        
            DOI : 
10.1109/DATE.2007.364427