Title :
Three-dimensional finite element analysis of inductance and capacitance metrices
Author :
Brauer, John R. ; Nopper, Richard W., Jr. ; Gates, David C.
Author_Institution :
MacNeal-Schwendler Corporation, 4300 W. Brown Deer Road, Milwaukee, WI 53223
Keywords :
Capacitance; Electrostatics; Finite element methods; Frequency domain analysis; Inductance; Integral equations; Magnetic analysis; Transmission line matrix methods; Voltage; Wire;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1992
Print_ISBN :
0-7803-0683-X
DOI :
10.1109/EPEP.1992.572272