DocumentCode
2643302
Title
Utilization of SECDED for Soft Error and Variation-Induced Defect Tolerance in Caches
Author
Hung, Luong D. ; Irie, Hidetsugu ; Goshima, Masahiro ; Sakai, Shuichi
Author_Institution
Graduate Sch. of Inf. Sci. & Technol., Tokyo Univ.
fYear
2007
fDate
16-20 April 2007
Firstpage
1
Lastpage
6
Abstract
Combination of SECDED with a redundancy technique can effectively tolerate a high variation-induced defect rate in future processes. However, while a defective cell in a block can be repaired by SECDED, the block becomes vulnerable to soft errors. This paper proposes a technique to deal with the degraded resilience against soft errors. Only clean data can be stored in defective blocks of a cache. This constraint is enforced through selective write-through mechanism. An error occurring in a defective block can be detected and the correct data can be obtained from the lower level caches
Keywords
Hamming codes; cache storage; error correction codes; integrated circuit testing; logic testing; redundancy; SECDED; caches; data correction; defective block; redundancy technique; soft error; variation-induced defect tolerance; Circuits; Computer errors; Decoding; Degradation; Delay; Error correction; Error correction codes; Random access memory; Redundancy; Resilience;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location
Nice
Print_ISBN
978-3-9810801-2-4
Type
conf
DOI
10.1109/DATE.2007.364447
Filename
4211957
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