• DocumentCode
    2643302
  • Title

    Utilization of SECDED for Soft Error and Variation-Induced Defect Tolerance in Caches

  • Author

    Hung, Luong D. ; Irie, Hidetsugu ; Goshima, Masahiro ; Sakai, Shuichi

  • Author_Institution
    Graduate Sch. of Inf. Sci. & Technol., Tokyo Univ.
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Combination of SECDED with a redundancy technique can effectively tolerate a high variation-induced defect rate in future processes. However, while a defective cell in a block can be repaired by SECDED, the block becomes vulnerable to soft errors. This paper proposes a technique to deal with the degraded resilience against soft errors. Only clean data can be stored in defective blocks of a cache. This constraint is enforced through selective write-through mechanism. An error occurring in a defective block can be detected and the correct data can be obtained from the lower level caches
  • Keywords
    Hamming codes; cache storage; error correction codes; integrated circuit testing; logic testing; redundancy; SECDED; caches; data correction; defective block; redundancy technique; soft error; variation-induced defect tolerance; Circuits; Computer errors; Decoding; Degradation; Delay; Error correction; Error correction codes; Random access memory; Redundancy; Resilience;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364447
  • Filename
    4211957