DocumentCode :
2643302
Title :
Utilization of SECDED for Soft Error and Variation-Induced Defect Tolerance in Caches
Author :
Hung, Luong D. ; Irie, Hidetsugu ; Goshima, Masahiro ; Sakai, Shuichi
Author_Institution :
Graduate Sch. of Inf. Sci. & Technol., Tokyo Univ.
fYear :
2007
fDate :
16-20 April 2007
Firstpage :
1
Lastpage :
6
Abstract :
Combination of SECDED with a redundancy technique can effectively tolerate a high variation-induced defect rate in future processes. However, while a defective cell in a block can be repaired by SECDED, the block becomes vulnerable to soft errors. This paper proposes a technique to deal with the degraded resilience against soft errors. Only clean data can be stored in defective blocks of a cache. This constraint is enforced through selective write-through mechanism. An error occurring in a defective block can be detected and the correct data can be obtained from the lower level caches
Keywords :
Hamming codes; cache storage; error correction codes; integrated circuit testing; logic testing; redundancy; SECDED; caches; data correction; defective block; redundancy technique; soft error; variation-induced defect tolerance; Circuits; Computer errors; Decoding; Degradation; Delay; Error correction; Error correction codes; Random access memory; Redundancy; Resilience;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
Type :
conf
DOI :
10.1109/DATE.2007.364447
Filename :
4211957
Link To Document :
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