Title :
Parametric spectral analysis tools for the characterization of A/D converters
Author :
Berthoumieu, Yannick ; Dallet, Dominique
Author_Institution :
Lab. de Microelectron., Bordeaux I Univ., Talence, France
Abstract :
This paper focuses on the estimation problem of typical parameters of the A/D converters. As basic assumption, the data output consists of a sum of real sinusoids. In this framework, we investigate the interest of the parametric spectral methods in the ADC testing. We give the detail of the three major estimation steps in order to retrieve all signal output parameters. Finally, we present the major advantage of this estimation scheme: the good results obtained in spite of the noncoherent frequency feature used in the test
Keywords :
analogue-digital conversion; parameter estimation; spectral analysis; A/D converters; ADC testing; estimation; frequency estimation; noncoherent frequency; parametric spectral methods; power estimation; real sinusoids; Analog-digital conversion; Frequency conversion; Frequency estimation; Matrix converters; Matrix decomposition; Performance analysis; Power system harmonics; Signal to noise ratio; Spectral analysis; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-3747-6
DOI :
10.1109/IMTC.1997.610291