DocumentCode :
2643384
Title :
Measurement corrections for phase noise characterization with different baseband analyzer
Author :
Leng, Toh Chee
Author_Institution :
Agilent Technol., Bayan Lepas Free Ind. Zone, Penang
fYear :
2007
fDate :
4-6 Dec. 2007
Firstpage :
1
Lastpage :
4
Abstract :
Phase noise characterization with different instrument required different measurement corrections. In this paper, with frequency discriminator method, two types of spectrum analyzer, e.g. swept signal analyzer and Fast Fourier Transform (FFT) analyzer are used. By looking into the different of operation for the instrument, different sets of correction factor are determined. Considering the correction factor into the phase noise characterization, the measurement results are compared. With a signal source analyzer, the measurement corrections are further verified. A correction measurement with corrections for compensating the instrument effect in phase noise characterization is discussed.
Keywords :
delay lines; fast Fourier transforms; oscillators; phase noise; spectral analysers; different baseband analyzer; fast Fourier transform; frequency discriminator; measurement corrections; phase noise characterization; spectrum analyzer; swept signal analyzer; Baseband; Delay lines; Frequency measurement; Instruments; Noise measurement; Oscillators; Phase measurement; Phase noise; Signal analysis; Spectral analysis; frequency discriminator; oscillator measurement; phase noise characterization; signal source analyzer; spectrum analyzer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Electromagnetics, 2007. APACE 2007. Asia-Pacific Conference on
Conference_Location :
Melaka
Print_ISBN :
978-1-4244-1434-5
Electronic_ISBN :
978-1-4244-1435-2
Type :
conf
DOI :
10.1109/APACE.2007.4603929
Filename :
4603929
Link To Document :
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