• DocumentCode
    2643485
  • Title

    Peering through the technology scaling fog

  • Author

    Mayberry, Mike

  • Author_Institution
    Components Res., Intel Corp., Hillsboro, OR, USA
  • fYear
    2012
  • fDate
    12-14 June 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    While walking in the fog, the path nearest you is relatively clear and then options broaden and become less clear as you peer further away. This paper will discuss which parts of the technology path forward are predictable and where inflection points may occur which require doing things differently. It is clear that many choices will need to be made in the next few years to be ready for technology in 2020 and beyond.
  • Keywords
    CMOS integrated circuits; integrated circuit interconnections; CMOS; inflection point; integration; interconnects; technology path forward; technology scaling fog; CMOS integrated circuits; Computer architecture; Dielectrics; Logic gates; Performance evaluation; Silicon; CMOS; NRI; devices; integration; interconnects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology (VLSIT), 2012 Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0743-1562
  • Print_ISBN
    978-1-4673-0846-5
  • Electronic_ISBN
    0743-1562
  • Type

    conf

  • DOI
    10.1109/VLSIT.2012.6242434
  • Filename
    6242434