Title :
An Automated General Purpose Test System for Solid State L.O.´s
Abstract :
Automation has provided a coat-effective solution to test problems associated with solid-state local oscillators. Computer controlled measurement and analysis for L.O.´s, L-Band through Ku-Band, is provided by a single system. Improved testing provides positive feedback to design efforts and enhances device tuning capability.
Keywords :
Automatic control; Automatic testing; Automation; Control system analysis; Control systems; Feedback; L-band; Local oscillators; Solid state circuits; System testing;
Conference_Titel :
Microwave Symposium Digest, 1974 S-MTT International
Conference_Location :
Atlanta, Georgia, USA
DOI :
10.1109/MWSYM.1974.1123568
