DocumentCode
2643814
Title
Automatic Load Contour Mapping for Microwave Power Transistors
Author
Cusack, J. ; Perlow, S. ; Perlman, B.
Volume
74
Issue
1
fYear
1974
fDate
12-14 June 1974
Firstpage
269
Lastpage
271
Abstract
A technique for large signal characterization of microwave power transistors is described. A computer controlled apparatus is used to map contours of constant output power and efficiency, on a Smith Chart, for dynamic matching of both input and output circuits.
Keywords
Circuits; Frequency; Impedance matching; Laboratories; Microwave theory and techniques; Power generation; Power transistors; Signal design; Tuners; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1974 S-MTT International
Conference_Location
Atlanta, Georgia, USA
Type
conf
DOI
10.1109/MWSYM.1974.1123569
Filename
1123569
Link To Document