DocumentCode :
2643861
Title :
An efficient algorithm to integrate scheduling and allocation in high-level test synthesis
Author :
Yang, Tianruo ; Peng, Zebo
Author_Institution :
Dept. of Comput. & Inf. Sci., Linkoping Univ., Sweden
fYear :
1998
fDate :
23-26 Feb 1998
Firstpage :
74
Lastpage :
81
Abstract :
This paper presents a high-level test synthesis algorithm for operation scheduling and data path allocation. Contrary to other works in which scheduling and allocation are performed independently, our approach integrates these two tasks by performing them simultaneously so that the effects of scheduling and allocation on testability are exploited more effectively. The approach is based on an algorithm which applies a sequence of semantics-preserving transformations to a design to generate an efficient RT level implementation from a VHDL behavioral specification. Experimental results show the advantages of the proposed algorithm
Keywords :
Petri nets; built-in self test; design for testability; high level synthesis; logic testing; scheduling; BIST; CAD; RT level implementation; VHDL behavioral specification; data path allocation; high-level test synthesis; operation scheduling; scheduling/allocation integration; semantics-preserving transformations; test synthesis algorithm; testability; Algorithm design and analysis; Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; Job shop scheduling; Performance evaluation; Processor scheduling; Scheduling algorithm; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 1998., Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-8359-7
Type :
conf
DOI :
10.1109/DATE.1998.655839
Filename :
655839
Link To Document :
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