The development and challenges of millimeter wave test system for package level

Author

Chiang, Lim Chee ; Shairi, Noor Azwan

Author_Institution

Wireless Semicond. Div. R&D, Avago Technol., Penang

fYear

2007

fDate

4-6 Dec. 2007

Firstpage

1

Lastpage

5

Abstract

The existing automated test system (ATS) for MMIC package level in Avago Technologies immature for the rigorous requirements of millimeter wave products testing. This has demanded the accountability for test development engineer to develop a new test system platform for MMIC product testing at millimeter wave frequencies. This particular test system comprises of test equipments and test software - test equipments are automatically controlled by the test software. This new developed platform comes with a wholly set of challenges during test development processes especially product correlation and product test time will be deliberately discussed on this paper.

Keywords

MMIC; automatic test equipment; automatic test software; circuit analysis computing; circuit testing; electronics packaging; MMIC package level; automated test system; millimeter wave frequencies; millimeter wave test system; package level; test development engineer; test software; Automatic control; Automatic testing; Control systems; Frequency; MMICs; Millimeter wave technology; Packaging machines; Software testing; System testing; Test equipment; MMIC testing; millimeter wave testing; test development; test system;

fLanguage

English

Publisher

ieee

Conference_Titel

Applied Electromagnetics, 2007. APACE 2007. Asia-Pacific Conference on

Conference_Location

Melaka

Print_ISBN

978-1-4244-1434-5

Electronic_ISBN

978-1-4244-1435-2

Type

conf

DOI

10.1109/APACE.2007.4603960

Filename

4603960