DocumentCode
2643945
Title
Towards Unifying Localization and Explanation for Automated Debugging
Author
Fey, Görschwin ; Sülflow, André ; Drechsler, Rolf
Author_Institution
Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
fYear
2010
fDate
13-15 Dec. 2010
Firstpage
3
Lastpage
8
Abstract
Today, there exist powerful algorithms for automated debugging. Some of the debugging algorithms focus on fault localization while others try to explain the faulty behavior by providing, e.g., correct traces that are similar to a failure trace. SAT-based debugging locates faults, but does not explain the faulty behavior, e.g., some temporal properties of fault candidates are not fully explored. In this work, we study the resolution of SAT-based debugging with respect to its capability to locate faults and to explain faults. A strategy is presented that increases the diagnostic resolution of SAT-based debugging by combining fault localization and fault explanation in one algorithm. The experimental results confirm the strength of the approach and give directions for further research.
Keywords
program debugging; software fault tolerance; SAT-based debugging; automated debugging; diagnostic resolution; fault explanation; fault localization; Accuracy; Benchmark testing; Circuit faults; Debugging; Hardware design languages; Logic gates; Signal resolution; Debugging; Explanation; Localization; SAT; Verification;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocessor Test and Verification (MTV), 2010 11th International Workshop on
Conference_Location
Austin, TX
ISSN
1550-409
Print_ISBN
978-1-61284-287-5
Type
conf
DOI
10.1109/MTV.2010.10
Filename
5976209
Link To Document