• DocumentCode
    2643945
  • Title

    Towards Unifying Localization and Explanation for Automated Debugging

  • Author

    Fey, Görschwin ; Sülflow, André ; Drechsler, Rolf

  • Author_Institution
    Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
  • fYear
    2010
  • fDate
    13-15 Dec. 2010
  • Firstpage
    3
  • Lastpage
    8
  • Abstract
    Today, there exist powerful algorithms for automated debugging. Some of the debugging algorithms focus on fault localization while others try to explain the faulty behavior by providing, e.g., correct traces that are similar to a failure trace. SAT-based debugging locates faults, but does not explain the faulty behavior, e.g., some temporal properties of fault candidates are not fully explored. In this work, we study the resolution of SAT-based debugging with respect to its capability to locate faults and to explain faults. A strategy is presented that increases the diagnostic resolution of SAT-based debugging by combining fault localization and fault explanation in one algorithm. The experimental results confirm the strength of the approach and give directions for further research.
  • Keywords
    program debugging; software fault tolerance; SAT-based debugging; automated debugging; diagnostic resolution; fault explanation; fault localization; Accuracy; Benchmark testing; Circuit faults; Debugging; Hardware design languages; Logic gates; Signal resolution; Debugging; Explanation; Localization; SAT; Verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocessor Test and Verification (MTV), 2010 11th International Workshop on
  • Conference_Location
    Austin, TX
  • ISSN
    1550-409
  • Print_ISBN
    978-1-61284-287-5
  • Type

    conf

  • DOI
    10.1109/MTV.2010.10
  • Filename
    5976209