DocumentCode :
264395
Title :
Critical Zone Recognition: Classification vs. regression
Author :
Bluvband, Zigmund ; Porotsky, Sergey ; Tropper, Shimon
Author_Institution :
ALD Group, Tel-Aviv, Israel
fYear :
2014
fDate :
22-25 June 2014
Firstpage :
1
Lastpage :
5
Abstract :
The article describes the Classification and Regression procedures, developed and successfully used for Critical Zone Recognition. One of the main tasks of the Prognostics and Health Management is the Failure Prognostics, specifically to provide predictive information regarding Remaining Useful Life (RUL) of device using prognostic systems. But sometimes it is necessary to get inflexible answer for closed type question: Is current device within critical zone or not? In other words, is RUL of device less than pre-defined Critical Value or not? To solve this problem, two approaches may be considered: · Regression Approach: to predict RUL value and compare results with critical value · Classification Approach: to recognize directly entering the critical zone In general, Classification Approach is more preferred for recognition tasks, but some aspects of the approach prevent to get an evident answer. Two models, based on modifications of the SVM method - SVC (Support Vector Classification) and SVR (Support Vector Regression) are proposed for consideration. Suggested methodology and algorithms were verified on the NASA Aircraft Engine database (http://ti.arc.nasa.gov/tech/dash/pcoe/prognostic-data-repository/). Numerical examples, based on this database, have been also considered.
Keywords :
aerospace computing; failure analysis; pattern classification; regression analysis; remaining life assessment; support vector machines; RUL; SVC; SVM method; SVR; classification approach; critical zone recognition; failure prognostics; predictive information; prognostic system; prognostics and health management; remaining useful life; support vector classification; support vector regression; Erbium; Hafnium; Kuiper belt; Magnetic resonance imaging; Noise measurement; Cross-Entropy; Cross-Validation; Prognostics; RUL Estimation; Remaining Useful Life; SVC; SVR;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Prognostics and Health Management (PHM), 2014 IEEE Conference on
Conference_Location :
Cheney, WA
Type :
conf
DOI :
10.1109/ICPHM.2014.7036386
Filename :
7036386
Link To Document :
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