Title :
Reliability analysis via numerical simulation of power electronic circuits
Author :
Kamas, Linda A. ; Sanders, Seth R.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
This paper gives conceptual background on reliability analysis in the presence of circuit parameter variation. A method for reliability analysis, the first-order reliability method (FORM), is described in detail and demonstrated on circuit examples. Simulation results are then compared to a Monte Carlo analysis
Keywords :
Monte Carlo methods; circuit analysis computing; circuit reliability; power electronics; Monte Carlo analysis; circuit parameter variation; circuit simulation; first-order reliability method; numerical simulation; power electronic circuits; reliability analysis; Analytical models; Circuit analysis computing; Circuit simulation; Computational modeling; Design automation; Equations; Integrated circuit reliability; Numerical simulation; Predictive models; Voltage;
Conference_Titel :
Computers in Power Electronics, 1994., IEEE 4th Workshop on
Conference_Location :
Trois-Rivieres, Que.
Print_ISBN :
0-7803-2091-3
DOI :
10.1109/CIPE.1994.396720
