Title :
Optical packaging of PLC optical splitter and their reliability tests
Author :
Chan, W.Y. ; Lambak, Zainuddin ; Adnan, Azliza J M ; Tengku, Imran A.
Author_Institution :
Photonic Devices Cluster, UPM-MTDC, Serdang
Abstract :
Optical packaging process and the results of reliability tests of a 1times4 optical power splitter is presented. In this process, the functional optical tests as well as environmental reliability tests are performed for the stability purpose. The maximum insertion loss (IL) of 7.0 dB with good uniformity of < 0.2 dB and low polarization-dependent loss (PDL) of 0.2 dB are obtained. The Swept Wavelength System (SWS) optical test shows the optical splitter can perform low IL well across the C-L band. Under the 50-cycles temperature- cycling test from -40degC to 85degC, IL variation of < 0.3 dB and PDL variation of < 0.07 dB are obtained. Low IL variation of < 0.21 dB is also obtained from the result of a 678-hours damp-heat test at 85degC/ 85% RH.
Keywords :
circuit reliability; electronics packaging; optical communication equipment; optical testing; PLC optical splitter; low polarization-dependent loss; maximum insertion loss; optical packaging process; planar lightwave circuit optical power splitter; swept wavelength system optical test; temperature -40 degC to 85 degC; Insertion loss; Optical losses; Optical polarization; Packaging; Page description languages; Performance evaluation; Power system reliability; Programmable control; Stability; Testing; optical packaging; optical splitter; reliability;
Conference_Titel :
Applied Electromagnetics, 2007. APACE 2007. Asia-Pacific Conference on
Conference_Location :
Melaka
Print_ISBN :
978-1-4244-1434-5
Electronic_ISBN :
978-1-4244-1435-2
DOI :
10.1109/APACE.2007.4603969