Title :
An automatic inspection system for hologram with multiple patterns
Author :
Kwon, Hyuk-Joong ; Park, Tae-Hyoung
Author_Institution :
Chungbuk Nat. Univ., Chungbuk
Abstract :
We propose an automatic inspection system for hologram with multiple patterns. The system hardware consists of illuminations, camera, and vision processor. Multiple illuminations using LED are arranged in different directions to acquire each image of patterns. The system software consists of pre-processing, pattern generation, and pattern matching. The acquired images of input hologram are compared with theirs reference patterns by developed matching algorithm. To compensate for the positioning error of input hologram, reference patterns of hologram for different position should be generated in on-line. We apply a frequency transformation based CGH (computer-generated hologram) method to generate reference images. For the fast pattern matching, we also apply the matching method in the frequency domain. Experimental results for hologram of Korean currency are then presented to verify the usefulness of proposed system.
Keywords :
automatic optical inspection; holography; image matching; light emitting diodes; LED; automatic inspection system; frequency transformation based computer-generated hologram method; hologram; image patterns; pattern generation; pattern matching; Cameras; Computer errors; Frequency; Hardware; Image generation; Inspection; Light emitting diodes; Lighting; Pattern matching; System software; Fourier transformation.; automatic inspection; computer-generated hologram; hologram; pattern matching;
Conference_Titel :
SICE, 2007 Annual Conference
Conference_Location :
Takamatsu
Print_ISBN :
978-4-907764-27-2
Electronic_ISBN :
978-4-907764-27-2
DOI :
10.1109/SICE.2007.4421441