Title :
Simulation methodology and experimental verification for the analysis of substrate noise on LC-VCO´s
Author :
Bronckers, S. ; Soens, C. ; Van der Plas, G. ; Vandersteen, G. ; Rolain, Y.
Author_Institution :
IMEC, Leuven
Abstract :
This paper presents a methodology for the analysis and prediction of the impact of wideband substrate noise on a LC-voltage controlled oscillator (LC-VCO) from DC up to local frequency (LO). The impact of substrate noise is modeled a priori in a high-ohmic 0.18mum 1P6M CMOS technology and then verified on silicon on a 900MHz LC-VCO. Below a frequency of 10MHz, the impact is dominated by the on-chip resistance of the VCO ground, while above 10MHz the bond wires, parasitics of the on-chip inductor and the PCB decoupling capacitors determine the behavior of the perturbation
Keywords :
CMOS integrated circuits; UHF integrated circuits; circuit simulation; integrated circuit noise; voltage-controlled oscillators; 0.18 micron; 10 MHz; 900 MHz; CMOS technology; PCB decoupling capacitors; VCO; on-chip inductor; on-chip resistance; substrate noise; voltage controlled oscillator; Analytical models; Bonding; CMOS technology; Frequency; Local oscillators; Semiconductor device modeling; Silicon; Voltage-controlled oscillators; Wideband; Wires;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
DOI :
10.1109/DATE.2007.364516
