• DocumentCode
    2644408
  • Title

    Low-Overhead Circuit Synthesis for Temperature Adaptation Using Dynamic Voltage Scheduling

  • Author

    Ghosh, Swaroop ; Bhunia, Swarup ; Roy, Kaushik

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Increasing power density causes die overheating due to limited cooling capacity of the package. Conventional thermal management techniques e.g. logic shutdown, clock gating, frequency scaling, simultaneous voltage-frequency tuning etc. increase the design complexity and/or degrade the performance significantly. In this paper, the authors propose a novel design technique, which makes a circuit amenable to temperature adaptation using dynamic voltage scheduling (DVS). It is accomplished by a synthesis technique that (a) isolates and predicts the set of paths that may become critical under variations, (b) ensures they are activated rarely, and (c) tolerates possible delay failures (at reduced voltage) in these paths by adaptive clock stretching. This allows us to schedule a lower supply voltage during increased temperature without requiring frequency tuning. Simulation results on an example pipeline show that proposed design yields similar temperature reduction as conventional design with only 11% performance penalty and 14% area overhead. The conventional pipeline design, on contrary, leads to 50% performance degradation due to reduced operating frequency
  • Keywords
    delays; integrated circuit design; logic design; thermal management (packaging); adaptive clock stretching; circuit synthesis; clock gating; delay failures; die overheating; dynamic voltage scheduling; frequency scaling; logic shutdown; power density; temperature adaptation; thermal management; Circuit synthesis; Clocks; Cooling; Dynamic scheduling; Dynamic voltage scaling; Frequency; Pipelines; Temperature; Thermal management; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364518
  • Filename
    4212028