DocumentCode :
2644419
Title :
Maximum Circuit Activity Estimation Using Pseudo-Boolean Satisfiability
Author :
Mangassarian, Hratch ; Veneris, Andreas ; Safarpour, Sean ; Najm, Farid N. ; Abadir, Magdy S.
Author_Institution :
Dept. of ECE, Toronto Univ., Ont.
fYear :
2007
fDate :
16-20 April 2007
Firstpage :
1
Lastpage :
6
Abstract :
Disproportionate instantaneous power dissipation may result in unexpected power supply voltage fluctuations and permanent circuit damage. Therefore, estimation of maximum instantaneous power is crucial for the reliability assessment of VLSI chips. Circuit activity and consequently power dissipation in CMOS circuits are highly input-pattern dependent, making the problem of maximum power estimation computationally hard. This work proposes a novel pseudo-Boolean satisfiability based method that reports the exact input sequence maximizing circuit activity in combinational and sequential circuits. The method is also extended to take multiple gate transitions into account by integrating delay information into the pseudo-Boolean optimization problem. An extensive suite of experiments on ISCAS85 and ISCAS89 circuits confirms the efficiency and robustness of the approach compared to simulation based techniques and encourages further research for low-power solutions using Boolean satisfiability
Keywords :
Boolean functions; CMOS integrated circuits; VLSI; combinational circuits; computability; integrated circuit reliability; low-power electronics; sequential circuits; CMOS circuits; VLSI chips; circuit damage; combinational circuits; instantaneous power dissipation; power estimation; power supply voltage fluctuations; pseudo-Boolean satisfiability; reliability assessment; sequential circuits; Circuit simulation; Delay; Optimization methods; Power dissipation; Power supplies; Robustness; Sequential circuits; Signal generators; Upper bound; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
Conference_Location :
Nice
Print_ISBN :
978-3-9810801-2-4
Type :
conf
DOI :
10.1109/DATE.2007.364519
Filename :
4212029
Link To Document :
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