• DocumentCode
    2644463
  • Title

    Automatic Fault Localization for SystemC TLM Designs

  • Author

    Le, Hoang M. ; Grosse, Daniel ; Drechsler, Rolf

  • Author_Institution
    Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
  • fYear
    2010
  • fDate
    13-15 Dec. 2010
  • Firstpage
    35
  • Lastpage
    40
  • Abstract
    To meet today´s time-to-market demands catching bugs as early as possible during the design of a system is absolutely essential. In Electronic System Level (ESL) design where SystemC has become the de-facto standard due to Transaction Level Modeling (TLM), many approaches for verification have been developed. They determine an error trace which demonstrates the difference between the required and the actual behavior of the system. However, the subsequent debugging process is very time-consuming, in particular due to TLM-related faults caused by complex process synchronization and concurrency. In this paper, we present an automatic fault localization approach for SystemC TLM designs. The approach determines components that can be changed such that the intended behavior of the design is obtained removing the contradiction given by the error trace. Techniques based on Bounded Model Checking (BMC) are used to find the components. We demonstrate the quality of our approach by experimental results.
  • Keywords
    C++ language; formal verification; software fault tolerance; SystemC TLM designs; bounded model checking; electronic system level design; fault localization approach; transaction level modeling; Debugging; Instruments; Object oriented modeling; Receivers; Schedules; Time domain analysis; Time varying systems; BMC; Debugging; SystemC; TLM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocessor Test and Verification (MTV), 2010 11th International Workshop on
  • Conference_Location
    Austin, TX
  • ISSN
    1550-409
  • Print_ISBN
    978-1-61284-287-5
  • Type

    conf

  • DOI
    10.1109/MTV.2010.15
  • Filename
    5976241