• DocumentCode
    2644470
  • Title

    Sub-fM DNA sensitivity by self-aligned maskless thin-film transistor-based SoC bioelectronics

  • Author

    Chen, Min-Cheng ; Lin, Chang-Hsien ; Lin, Chia-Yi ; Hsueh, Fu-Kuo ; Huang, Wen-Hsien ; Lien, Yu-Chung ; Chen, Hsiu-Chih ; Hsueh, Hsiao-Ting ; Huang, Che-Wei ; Lin, Chih-Ting ; Liu, Yin-Chih ; Lee, Ta-Hsien ; Hua, Mu-Yi ; Qiu, Jian-Tai ; Liu, Mao-Chen ; Le

  • Author_Institution
    Nat. Nano Device Labs., Hsinchu, Taiwan
  • fYear
    2012
  • fDate
    12-14 June 2012
  • Firstpage
    127
  • Lastpage
    128
  • Abstract
    This is the first study to successfully achieve record DNA sensitivity (sub-fM) by self-aligned, maskless, dual-channel, and metal-gate-based thin-film transistor nano-wire FET. Both novel device architecture (dual-channel) and optimization of integration processes (microcrystalline silicon and self-aligned sidewall sub-50 nm critical dimension) of nano-wire FET enhance the sensitivity to biological entities substantially. Meanwhile, the proposed device is accomplished with an embedded VLSI CMOS circuit. It can thus offer high application potential to pH, protein, and DNA probing in SoC-based portable bioelectronics.
  • Keywords
    CMOS integrated circuits; DNA; VLSI; biomolecular electronics; embedded systems; field effect transistors; nanowires; pH; proteins; system-on-chip; thin film transistors; DNA probing; SoC-based portable bioelectronics; biological entities; device architecture; dual-channel thin-film transistor; embedded VLSI CMOS circuit; integration process; metal-gate-based thin-film transistor; microcrystalline silicon; nano-wire FET; pH; protein; self-aligned maskless thin-film transistor; self-aligned sidewall; size 50 nm; subfM DNA sensitivity; CMOS integrated circuits; DNA; FETs; Logic gates; Nanobioscience; Nanoscale devices; Sensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology (VLSIT), 2012 Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0743-1562
  • Print_ISBN
    978-1-4673-0846-5
  • Electronic_ISBN
    0743-1562
  • Type

    conf

  • DOI
    10.1109/VLSIT.2012.6242494
  • Filename
    6242494