Title :
A Fault Grading Methodology for Software-Based Self-Test Programs in Systems-on-Chip
Author :
Ballan, O. ; Bernardi, P. ; Fontana, G. ; Grosso, M. ; Sanchez, E.
Author_Institution :
STMicroelectronics, Agrate Brianza, Italy
Abstract :
Today, electronic devices are increasingly employed in different fields, including safety- and mission-critical applications, where the quality of the product is an essential requirement. In the automotive field, the Software-Based Self-Test is a dependability technique currently demanded by industrial standards. This paper presents an approach employed by STMicro electronics for evaluating, or grading, the effectiveness of Software-Based Self-Test procedure used for on-line testing automotive microcontrollers to be included in safety-critical vehicle parts, such as in airbags and steering systems.
Keywords :
automobile industry; automotive components; automotive engineering; mechanical testing; steering systems; system-on-chip; airbags; automotive field; automotive microcontroller; fault grading methodology; industrial standards; safety-critical vehicle parts; software-based self-test programs; steering systems; systems-on-chip; Automotive engineering; Built-in self-test; Circuit faults; Integrated circuit modeling; Safety; System-on-a-chip; Microprocessor testing; Software-Based Self-Test; fault grading;
Conference_Titel :
Microprocessor Test and Verification (MTV), 2010 11th International Workshop on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-61284-287-5
DOI :
10.1109/MTV.2010.16
