• DocumentCode
    2645055
  • Title

    Sum and difference pattern with common aperture tail

  • Author

    Álvarez-Folgueiras, M. ; Rodríguez-Gonzalez, J.A. ; Ares-Pena, F.

  • Author_Institution
    Dept. of Appl. Phys., Univ. of Santiago de Compostela, Santiago de Compostela, Spain
  • fYear
    2009
  • fDate
    1-5 June 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    For tracking and search design array antennas is very usually the optimization of the main beam sum pattern to sidelobe level ratio, SLL, while still maintaining high directivity of the main beam. For tracking systems, a difference pattern is needed as an auxiliary pattern with a boresight null coincident with the beam peak of the main (sum) pattern. The tracking drive system moves the antenna positioner until the signal in this difference channel reaches a minimum, thereby causing the main channel (sum) to point accurately at the radar target. Aperture distributions of sum good patterns, e. g. Taylor distributions, and difference patterns, e. g. Bayliss distributions, are different. Theoretically, two independent excitations could be applied to the search-and-track antenna in order to achieve good features in both patterns. However, this approach requires a feed network too complex to make a practical design feasible.
  • Keywords
    antenna arrays; antenna radiation patterns; aperture antennas; Bayliss distributions; Taylor distributions; antenna positioner; aperture distributions ]; auxiliary pattern; boresight null coincident; common aperture tail; design array antennas; difference patterns; main beam sum pattern; radar target; search-and-track antenna; sidelobe level ratio; sum and difference pattern; tracking drive system; tracking systems; Antenna arrays; Antenna theory; Aperture antennas; Design optimization; Physics; Probability distribution; Radar antennas; Radar tracking; Tail; Target tracking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE
  • Conference_Location
    Charleston, SC
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4244-3647-7
  • Type

    conf

  • DOI
    10.1109/APS.2009.5171585
  • Filename
    5171585