Title :
Accurate chip leakage prediction: Challenges and solutions
Author :
Yu, Xiaojun ; Deng, Jie ; Loo, Sim ; Dezfulian, Kevin ; Lichtensteiger, Susan ; Bickford, Jeanne ; Habib, Nazmul ; Chang, Paul ; Mocuta, Anda ; Rim, Ken
Author_Institution :
SRDC, IBM, Hopewell Junction, NY, USA
Abstract :
A systematic method is proposed to address modeling challenges in accurate chip level leakage prediction, namely a precise total leakage width count method, a simple model to quantify leakage uplift caused by systematic across-chip variation, and a consistent model to capture 3-sigma leakage and leakage spread at fixed performance.
Keywords :
integrated circuit modelling; 3-sigma leakage; chip leakage prediction; leakage spread; leakage uplift; modeling challenges; systematic across-chip variation; total leakage width count method; Correlation; Delay; Integrated circuit modeling; Performance evaluation; Predictive models; Stacking; Systematics; IDDQ; Stacking factor; across-chip variation; leakage spread;
Conference_Titel :
VLSI Technology (VLSIT), 2012 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4673-0846-5
Electronic_ISBN :
0743-1562
DOI :
10.1109/VLSIT.2012.6242526
