DocumentCode
2645749
Title
Multiple fault detection and location in WSI baseline interconnection networks
Author
Feng, C. ; Huang, W.-K. ; Lombardi, F.
Author_Institution
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
fYear
1990
fDate
23-25 Jan 1990
Firstpage
145
Lastpage
151
Abstract
Presents an approach for the full diagnosis (detection and location) of baseline interconnection networks implemented in WSI. A multiple fault model as applicable to production of these devices, is assumed. This implies that a totally exhaustive combinatorial fault model is used in the analysis. It is proved that the maximum number of tests for detecting multiple faults (i.e. 2(1+log2N ), where N is the number of inputs/outputs), can be used to locate and identify multiple faulty switching elements provided that no intermittent and/or transient behaviour is present, i.e. using the definition of no logically undefined and no undetermined outputs are present. The proposed diagnostic technique is based on a process which reveals the switching state of each element on a stage by stage basis using the test set. No additional hardware is therefore required. The proposed technique can be efficiently used in the manufacturing of complex interconnection networks using advanced integration techniques such as WSI
Keywords
VLSI; electronic switching systems; fault location; integrated circuit testing; multiprocessor interconnection networks; WSI baseline interconnection networks; detecting multiple faults; diagnostic technique; exhaustive combinatorial fault model; full diagnosis; identify multiple faulty switching elements; maximum number of tests; multiple fault detection; multiple fault location; multiple fault model; stage by stage basis; test set; Computer networks; Computer science; Electrical fault detection; Fault detection; Fault diagnosis; Hardware; Intelligent networks; Logic testing; Multiprocessor interconnection networks; Partial response channels;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Scale Integration, 1990. Proceedings., [2nd] International Conference on
Conference_Location
San Francisco, CA
Print_ISBN
0-8186-9013-5
Type
conf
DOI
10.1109/ICWSI.1990.63895
Filename
63895
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