• DocumentCode
    2645781
  • Title

    Aliasing probability in multiple input linear signature automata for q-ary symmetric errors

  • Author

    Edirisooriya, Geetani ; Robinson, John P.

  • Author_Institution
    Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
  • fYear
    1991
  • fDate
    14-16 Oct 1991
  • Firstpage
    352
  • Lastpage
    355
  • Abstract
    The aliasing probability in single and multiple input linear automata signature registers (LASRs: linear feedback shift registers (LFSRs) and linear cellular automata) has been widely studied under the independent bit error model. Aliasing in a class of multiple-input LASRs (MILASRs) under the q-ary symmetric error model is examined. By modeling the signature analyzer as a two state Markov process, it is shown that the closed form expression previously derived for aliasing probability for multiple-input LFSRs with primitive polynomials holds for a far more general class of linear automata signature analyzers, including all multiple-input LFSRs. An easily verifiable criterion is given to determine whether a MILASR falls into this category. It is shown that for q-ary symmetric errors, the circuit complexity and the propagation delay can be minimized by using a set of m single bit LFSRs
  • Keywords
    Markov processes; delays; feedback; finite automata; logic testing; shift registers; aliasing probability; circuit complexity; closed form expression; independent bit error model; linear automata signature registers; linear cellular automata; linear feedback shift registers; multiple input linear signature automata; primitive polynomials; propagation delay; q-ary symmetric errors; signature analyzer; two state Markov process; Automata; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Cities and towns; Computer errors; Markov processes; Polynomials; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1991. ICCD '91. Proceedings, 1991 IEEE International Conference on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-8186-2270-9
  • Type

    conf

  • DOI
    10.1109/ICCD.1991.139917
  • Filename
    139917