• DocumentCode
    2646100
  • Title

    Interconnect tuning strategies for high-performance ICs

  • Author

    Kahng, Andrew B. ; Muddu, Sudhakar ; Sarto, Egino ; Sharma, Rahul

  • Author_Institution
    Silicon Graphics Comput. Syst., Mountain View, CA, USA
  • fYear
    1998
  • fDate
    23-26 Feb 1998
  • Firstpage
    471
  • Lastpage
    478
  • Abstract
    Interconnect tuning is an increasingly critical degree of freedom in the physical design of high-performance VLSI systems. By interconnect tuning, we refer to the selection of line thicknesses, widths and spacings in multi-layer interconnect to simultaneously optimize signal distribution, signal performance, signal integrity, and interconnect manufacturability and reliability. This is a key activity in most leading-edge design projects, but has received little attention in the literature. Our work provides the first technology-specific studies of interconnect tuning in the literature. We center on global wiring layers and interconnect tuning issues related to bus routing, repeater insertion, and choice of shielding/spacing rules for signal integrity and performance. We address four basic questions. (1) How should width and spacing be allocated to maximize performance for a given line pitch? (2) For a given line pitch, what criteria affect the optimal interval at which repeaters should be inserted into global interconnects? (3) Under what circumstances are shield wires the optimum technique for improving interconnect performance? (4) In global interconnect with repeaters, what other interconnect tuning is possible? Our study of question (4) demonstrates a new approach of offsetting repeater placements that can reduce worst-case cross-chip delays by over 30% in current technologies
  • Keywords
    VLSI; circuit layout CAD; delays; integrated circuit interconnections; integrated circuit layout; network routing; bus routing; global wiring layers; high-performance ICs; high-performance VLSI systems; interconnect tuning strategies; line pitch; line spacing; line thickness; line width; multi-layer interconnect; physical design; repeater insertion; repeater placement offsetting; shielding/spacing rules; signal distribution; signal integrity; Clocks; Electrical capacitance tomography; Integrated circuit interconnections; Manufacturing; Repeaters; Signal design; Silicon; Very large scale integration; Wires; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 1998., Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-8359-7
  • Type

    conf

  • DOI
    10.1109/DATE.1998.655900
  • Filename
    655900