• DocumentCode
    2646178
  • Title

    A fully digital controlled off-chip IDDQ measurement unit

  • Author

    Straka, B. ; Manhaeve, H. ; Vanneuville, J. ; Svajda, M.

  • Author_Institution
    CEDO, Brno, Czech Republic
  • fYear
    1998
  • fDate
    23-26 Feb 1998
  • Firstpage
    495
  • Lastpage
    500
  • Abstract
    The paper describes a new Digital controlled Off-Chip IDDQ Measurement Unit (DOCIMU), which provides reliable precision and relatively fast measurements, even with a high capacitive load, while the Device Under Test (DUT) is unaffected. The maximal resolution is 50 nA and the accurate measurement range is 1 mA. Unlike other IDDQ monitors, the DOCIMU copes with external interference, as it needs no analogue pin to set the IDDQ limit and the noise at the VDD is eliminated via a special S/H feature. The DOCIMU is also a testable IDDQ monitor, which is another unique feature
  • Keywords
    CMOS integrated circuits; automatic test equipment; computerised monitoring; digital instrumentation; electric current measurement; electromagnetic interference; integrated circuit testing; interference suppression; 1 mA; 50 nA; ATE; CMOS IC testing; EMI immunity; S/H feature; digitally-controlled measurement unit; external interference; high capacitive load; off-chip IDDQ measurement unit; sample/hold feature; testable IDDQ monitor; Digital control; Measurement units;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 1998., Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-8359-7
  • Type

    conf

  • DOI
    10.1109/DATE.1998.655904
  • Filename
    655904
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2646178