DocumentCode
2646219
Title
A New Load-Pull Characterization Method for Microwave Power Transistors
Author
Takayama, Yoichiro
fYear
1976
fDate
14-16 June 1976
Firstpage
218
Lastpage
220
Abstract
A novel method for microwave power transistor load-pull characterization is presented. The method provides an equivalent load-pull measurement technique without using an output impedance tuner. In this method, both input and output ports of a test transistor are simultaneously driven by external signals at the same specified frequency. Results of its application to a medium-power GaAs FET are given.
Keywords
Frequency; Gallium arsenide; Impedance; Measurement techniques; Microwave FETs; Microwave theory and techniques; Microwave transistors; Power transistors; Testing; Tuners;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium, 1976 IEEE-MTT-S International
Conference_Location
Cherry Hill, NJ, USA
Type
conf
DOI
10.1109/MWSYM.1976.1123701
Filename
1123701
Link To Document