DocumentCode
2646234
Title
An improved reliability model based on software architecture
Author
Liu, Chang ; Zheng, Jun ; Ren, Zhanyong
Author_Institution
China Aeronaut. Polytechnology Establ., Beijing, China
Volume
7
fYear
2010
fDate
16-18 April 2010
Abstract
Applications of existing architecture-based software reliability models are strictly limited to software in which the component transitions satisfy the Markov properties. When software has both deterministic and probabilistic behaviors, these models intentionally model it as Markov process, of which the reliability estimation with lowered accuracy comes as a result. The objective of this paper is to present a new reliability model that can resolve the heterogeneous software architectures which do not fully satisfy the Markov properties. We firstly extend UML sequence diagram to model heterogeneous software architecture. Secondly different types of deterministic component transitions are analyzed. And finally an algorithm generating Markov chain from heterogeneous software architecture is presented. A comparison of reliability estimation result of this new model with existing ones is given with a case study, which indicates a better estimation result could be obtained by this new model.
Keywords
Markov processes; Unified Modeling Language; estimation theory; object-oriented programming; probability; software architecture; software reliability; Markov chain; Markov process; Markov property; UML sequence diagram; architecture-based software reliability models; deterministic behavior; deterministic component transitions; heterogeneous software architectures; probabilistic behaviors; reliability estimation; Collaborative software; Frequency; Markov processes; Software algorithms; Software architecture; Software design; Software reliability; Software systems; Stochastic processes; Unified modeling language; Markov chain; software architecture; software component; software reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Engineering and Technology (ICCET), 2010 2nd International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-6347-3
Type
conf
DOI
10.1109/ICCET.2010.5485260
Filename
5485260
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