DocumentCode
2646238
Title
Microsystems testing: an approach and open problems
Author
Lubaszewski, Marcelo ; Cota, Erika F. ; Courtois, B.
Author_Institution
DELET/UFRGS, Porto Alegre, Brazil
fYear
1998
fDate
23-26 Feb 1998
Firstpage
524
Lastpage
528
Abstract
In this work a Computer-Aided Testing (CAT) tool is proposed that brings a systematic way of dealing with testing problems in emerging microsystems. Experiments with case-studies illustrate the techniques and tools embedded in the CAT environment. Some of the open problems that shall be addressed in the near future as an extension to this work are also discussed
Keywords
automatic testing; built-in self test; design for testability; fault diagnosis; integrated circuit testing; micromechanical devices; BIST; DFT; computer-aided testing tool; fault modelling; fault simulation; microsystems testing; test generation; Circuit faults; Circuit testing; Computational modeling; Context modeling; Detectors; Electrical fault detection; Electronic equipment testing; Fault detection; Signal design; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 1998., Proceedings
Conference_Location
Paris
Print_ISBN
0-8186-8359-7
Type
conf
DOI
10.1109/DATE.1998.655908
Filename
655908
Link To Document