DocumentCode
2646471
Title
Electron and ion beam generation from a pseudospark
Author
Yin, H. ; Cross, A.W. ; He, W. ; Ronald, K. ; Phelps, A.D.R.
Author_Institution
Dept. of Phys., Strathclyde Univ., Glasgow
fYear
2006
fDate
4-8 June 2006
Firstpage
142
Lastpage
142
Abstract
Summary form only given. Because of its unusual and interesting discharge properties, the pseudospark (ps) has attracted significant attention from diverse fields such as material processing, pulsed-power switching, electron beam generation, free electron masers, ion beam generation, extreme-ultraviolet radiation sources, microthrusters, and pseudospark-triggered wakefield accelerators, etc. A pseudospark discharge has indeed shown to be a promising source of high brightness, high intensity electron beam pulses. During a pseudospark discharge, a low temperature plasma is formed which acts as a copious source of electrons and ions and can be regarded as a low work function surface that facilitates electron and ion extraction. This paper will present some measurements and results of ps discharge experiments, ps-sourced electron and ion beam experiments. Pulsed electron beams with current intensity over 108 A m-2, high brightness up to 10 12 A m-2 rad-2 and emittance of tens of mm mrad were produced from a multi-gap ps discharge. The electron beam was applied in a Cherenkov maser interaction. The transportation of the ps electron beams is also investigated in order to produce high peak current, high quality, short (~100 picosecond) or long duration (2~100 ns) high-brightness electron beam pulses. Recent results from a high current density ps-produced ion beam experimentally investigated with hydrogen gas will be presented
Keywords
electron beams; electron sources; ion beams; ion sources; particle beam dynamics; particle beam extraction; plasma sources; plasma transport processes; sparks; Cherenkov maser interaction; current intensity; electron beam generation; electron extraction; electron source; emittance; extreme-ultraviolet radiation sources; free electron masers; ion beam generation; ion extraction; ion source; low temperature plasma; low work function surface; material processing; microthrusters; pseudospark discharge; pulsed-power switching; wakefield accelerators; Brightness; Electron beams; Fault location; Ion beams; Masers; Materials processing; Plasma accelerators; Plasma measurements; Plasma temperature; Pulse generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
Conference_Location
Traverse City, MI
Print_ISBN
1-4244-0125-9
Type
conf
DOI
10.1109/PLASMA.2006.1707014
Filename
1707014
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