DocumentCode :
2646471
Title :
Electron and ion beam generation from a pseudospark
Author :
Yin, H. ; Cross, A.W. ; He, W. ; Ronald, K. ; Phelps, A.D.R.
Author_Institution :
Dept. of Phys., Strathclyde Univ., Glasgow
fYear :
2006
fDate :
4-8 June 2006
Firstpage :
142
Lastpage :
142
Abstract :
Summary form only given. Because of its unusual and interesting discharge properties, the pseudospark (ps) has attracted significant attention from diverse fields such as material processing, pulsed-power switching, electron beam generation, free electron masers, ion beam generation, extreme-ultraviolet radiation sources, microthrusters, and pseudospark-triggered wakefield accelerators, etc. A pseudospark discharge has indeed shown to be a promising source of high brightness, high intensity electron beam pulses. During a pseudospark discharge, a low temperature plasma is formed which acts as a copious source of electrons and ions and can be regarded as a low work function surface that facilitates electron and ion extraction. This paper will present some measurements and results of ps discharge experiments, ps-sourced electron and ion beam experiments. Pulsed electron beams with current intensity over 108 A m-2, high brightness up to 10 12 A m-2 rad-2 and emittance of tens of mm mrad were produced from a multi-gap ps discharge. The electron beam was applied in a Cherenkov maser interaction. The transportation of the ps electron beams is also investigated in order to produce high peak current, high quality, short (~100 picosecond) or long duration (2~100 ns) high-brightness electron beam pulses. Recent results from a high current density ps-produced ion beam experimentally investigated with hydrogen gas will be presented
Keywords :
electron beams; electron sources; ion beams; ion sources; particle beam dynamics; particle beam extraction; plasma sources; plasma transport processes; sparks; Cherenkov maser interaction; current intensity; electron beam generation; electron extraction; electron source; emittance; extreme-ultraviolet radiation sources; free electron masers; ion beam generation; ion extraction; ion source; low temperature plasma; low work function surface; material processing; microthrusters; pseudospark discharge; pulsed-power switching; wakefield accelerators; Brightness; Electron beams; Fault location; Ion beams; Masers; Materials processing; Plasma accelerators; Plasma measurements; Plasma temperature; Pulse generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
Conference_Location :
Traverse City, MI
Print_ISBN :
1-4244-0125-9
Type :
conf
DOI :
10.1109/PLASMA.2006.1707014
Filename :
1707014
Link To Document :
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