DocumentCode :
2646481
Title :
Decoupling capacitor effects on switching noise
Author :
Downing, R. ; Gebler, P. ; Katopis, G.
Author_Institution :
East Fishkill Semiconductor Laboratory, IBM
fYear :
1992
fDate :
22-24 Apr 1992
Firstpage :
148
Lastpage :
150
Keywords :
Capacitors; Circuit noise; Circuit testing; Driver circuits; Noise reduction; Packaging; Probes; Semiconductor device noise; System testing; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 1992
Print_ISBN :
0-7803-0683-X
Type :
conf
DOI :
10.1109/EPEP.1992.572291
Filename :
572291
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2646481
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