Title :
Fourier spectrum based periodic cell pattern elimination in thin film transistor liquid crystal display cell image
Author :
Jung, Chang-Do ; Kim, Se-Yun ; Lee, Hee-Yul ; Yun, Byoung-Ju ; Lee, Joon-Jae ; Lim, Young-Do ; Park, Kil-Houm
Author_Institution :
Dept. of Math., Kyungpook Nat. Univ., Daegu, South Korea
Abstract :
This paper presents a hardware that inspects defects on TFT-LCD cell modules and packed in a PCI-board equipped with FPGA and DSP processors. Images of TFT-LCD cell modules normally contain periodic cell patterns which make it difficult to detect defects. We propose an efficient and powerful algorithm for elimination of the cell pattern using magnitude spectrum analysis.
Keywords :
digital signal processing chips; discrete Fourier transforms; electronics packaging; field programmable gate arrays; flat panel displays; inspection; liquid crystal displays; thin film transistors; DSP processor; FPGA processor; Fourier spectrum based periodic cell pattern elimination; PCI board; TFT-LCD cell modules; magnitude spectrum analysis; thin film transistor liquid crystal display cell image; Algorithm design and analysis; Digital signal processing; Discrete Fourier transforms; Frequency domain analysis; Inspection; Liquid crystal displays; Thin film transistors;
Conference_Titel :
Consumer Electronics (ICCE), 2011 IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-8711-0
DOI :
10.1109/ICCE.2011.5722911
