DocumentCode :
2646749
Title :
Time resolved spot size measurements using a self magnetic pinch diode on EROS
Author :
Portillo, S. ; Oliver, B.V. ; Lutz, S. ; Droemer, D. ; Rose, D.V. ; Critchley, A. ; Jones, A. ; Threadgold, J.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM
fYear :
2006
fDate :
4-8 June 2006
Firstpage :
156
Lastpage :
156
Abstract :
Summary form only given. Sandia National Laboratories is participating in an intensive research effort into high brightness, electron beam, flash radiographic X-ray sources. One of the sources being investigated is the self magnetic pinch (SMP) diode, that consists of a hollow tapered stalk as the cathode and a bremsstrahlung converter as the anode. The bremsstrahlung converter is comprised of a thin foil backed by a high Z target. Electron beam interactions with anode/cathode plasmas can greatly influence the dynamics of the beam spot on target which is a standard performance metric. Typically, the time integrated spot size is measured via a rolled edge and a detector such as X-ray film or imaging plates. However, time-dependent size measurement offers insight to the dynamics of the beam-plasma interactions occurring on few nanosecond time scales. A time resolved spot size diagnostic has been fielded on a series of SMP experiments carried out on the AWE EROS accelerator. The SMP experiments consisted of several geometric variations from the standard SMP configuration. Of particular interest is the effect of thin foils placed in front of the high-Z targets on the temporal and integrated spot size. A summary of the measurements is presented along with preliminary interpretations and modeling of the diode dynamic behavior
Keywords :
bremsstrahlung; electron beams; pinch effect; plasma X-ray sources; plasma diagnostics; plasma diodes; plasma-beam interactions; EROS accelerator; X-ray film detector; X-ray imaging plates; anode; beam-plasma interactions; bremsstrahlung converter; cathode; electron beam; flash radiographic X-ray sources; hollow tapered stalk; self magnetic pinch diode; time resolved spot size measurements; Anodes; Brightness; Cathodes; Diodes; Electron beams; Laboratories; Plasma measurements; Plasma sources; Radiography; Size measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
Conference_Location :
Traverse City, MI
Print_ISBN :
1-4244-0125-9
Type :
conf
DOI :
10.1109/PLASMA.2006.1707028
Filename :
1707028
Link To Document :
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