DocumentCode :
2646864
Title :
Power flow modeling for RITS-6
Author :
Bruner, Nichelle ; Genoni, Tom ; Rose, David ; Welch, Dale ; Johnson, David ; Oliver, Bryan
Author_Institution :
Voss Sci., LLC, Albuquerque, NM
fYear :
2006
fDate :
4-8 June 2006
Firstpage :
161
Lastpage :
161
Abstract :
Summary form only given. Sandia National Laboratories began commissioning the six-stage inductive voltage adder (IVA) configuration of its Radiographic Integrated Test Stand (RITS-6) in 2006. The lower impedance IVA technology results in excess power-flow from the transmission line to the diode region. Schemes to divert the excess flow include attaching a large-radius field shaper ("knob") to the transmission line immediately upstream from the diode region with a correspondingly larger anode radius ("dustbin"). The RITS-6 commissioning includes a series of shots with a blade-diode load for configurations with and without the dustbin and knob. Numerical modeling of each configuration was conducted prior to commissioning using the particle-in-cell code LSP. Modeling included power flow from the transmission line to a blade-diode load with load impedances ranging from under- to over-matched. Simulation results for transmission line currents and impedances for each blade-diode configuration are presented. These results identified geometries which result in cavity resonances and undesirable voltage fluctuations. Efforts to understand and mitigate these resonances are discussed
Keywords :
diodes; impedance matching; power transmission lines; pulsed power supplies; LSP; RITS-6; Radiographic Integrated Test Stand; blade-diode load; cavity resonances; field shaper; inductive voltage adder; load impedances; particle-in-cell code; power flow modeling; transmission line; voltage fluctuations; Diodes; Impedance; Joining processes; Laboratories; Load flow; Power transmission lines; Radiography; Resonance; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
Conference_Location :
Traverse City, MI
Print_ISBN :
1-4244-0125-9
Type :
conf
DOI :
10.1109/PLASMA.2006.1707033
Filename :
1707033
Link To Document :
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