DocumentCode :
2646896
Title :
Study of power module package structures
Author :
Ohbu, Toshiharu ; Kodani, Kazuya ; Tada, Nobumitsu ; Matsumoto, Toshiaki ; Kijima, Kenji ; Saito, Suzuo
Author_Institution :
Toshiba Corp., Tokyo, Japan
fYear :
2000
fDate :
2000
Firstpage :
46
Lastpage :
50
Abstract :
In order to realize a high current power module, we studied optimum chip layout with lowest chip temperature rise, and the reduction method of contact thermal resistance. We showed that about 24% reduction of chip temperature rise was possible. In order to inhibit surge voltages, we studied the optimum bus-bar structure. The stray inductance of the bus-bar showed that about 40% reduction was possible
Keywords :
busbars; circuit layout; circuit optimisation; heating; inductance; modules; optimisation; power semiconductor devices; semiconductor device packaging; surge protection; thermal management (packaging); thermal resistance; bus-bar stray inductance; chip temperature; chip temperature rise; contact thermal resistance reduction method; high current power module; optimum bus-bar structure; optimum chip layout; power module package structures; surge voltages; Cogeneration; Contact resistance; Copper; Electronic packaging thermal management; Heat sinks; Insulation; Multichip modules; Temperature distribution; Thermal resistance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Power Packaging, 2000. IWIPP 2000. International Workshop on
Conference_Location :
Waltham, MA
Print_ISBN :
0-7803-6437-6
Type :
conf
DOI :
10.1109/IWIPP.2000.885180
Filename :
885180
Link To Document :
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