Title :
WKB approximation based formula for tunneling probability through a multi-layer potential barrier
Author :
Mazurak, Andrzej ; Majkusiak, Bogdan
Author_Institution :
Inst. of Microelectron. & Optoelectron., Warsaw Univ. of Technol., Warsaw, Poland
Abstract :
In this work, we present a theoretical derivation of the analytical formula for tunneling probability through an n-layer barrier basing on the Wentzel-Kramers-Brillouin (WKB) and the effective mass approximations. The accuracy of the derived formula is analysed by comparison with the transfer matrix method (TMM). The effect of the electric charge distribution in a stack on the tunnel current is considered.
Keywords :
approximation theory; electric charge; probability; tunnelling; TMM; WKB approximation; Wentzel-Kramers-Brillouin approximation; effective mass approximation; electric charge distribution effect; multilayer potential barrier; n-layer barrier; transfer matrix method; tunnel current stack; tunneling probability; Accuracy; Analytical models; Approximation methods; Effective mass; Logic gates; Substrates; Tunneling; MOS structures; modelling; tunneling;
Conference_Titel :
Computational Electronics (IWCE), 2012 15th International Workshop on
Conference_Location :
Madison, WI
Print_ISBN :
978-1-4673-0705-5
DOI :
10.1109/IWCE.2012.6242846