DocumentCode :
2647162
Title :
Full-band study of ultra-thin Si:P nanowires
Author :
Ryu, Hoon ; Lee, Sunhee ; Tan, Yui-Hong Matthias ; Weber, Bent ; Mahapatra, Suddhasatta ; Simmons, Michelle Y. ; Hollenberg, Lloyd C L ; Klimeck, Gerhard
Author_Institution :
Supercomput. Center, Korea Inst. of Sci. & Technol. Inf. (KISTI), Daejeon, South Korea
fYear :
2012
fDate :
22-25 May 2012
Firstpage :
1
Lastpage :
4
Abstract :
Metallic property and Ohmic conduction in densely phosphorus δ-doping ultra-thin silicon nanowires (Si:P NWs) are studied. A 10-band sp3 d5 s* tight-binding approach is used to describe device electronic structures atomistically. Electrostatics at equilibrium are self-consistently calculated with our in-house 3-D parallel Schrödinger-Poisson solver that is coupled to the Local Density Approximation to consider the electron exchange-correlation in simulations. We not only confirm the NW channel is metallic by calculating the equilibrium bandstructure of a 1.5nm wide and 1/4 atomic monolayer doping [110] Si:P NW, but also provide a strong connection to experiment by calculating ohmic conduction properties of a few NW channels and showing a quantitatively good agreement to the measured data. This work can be highlighted as the first study of Si:P NWs with a full-band atomistic approach.
Keywords :
Schrodinger equation; density functional theory; electrostatics; elemental semiconductors; nanowires; phosphorus; silicon; tight-binding calculations; NW channel; Si:P; atomic monolayer doping; densely phosphorus δ-doping ultrathin silicon nanowires; device electronic structures; electron exchange-correlation; electrostatics; equilibrium band structure; full-band atomistic approach; full-band study; in-house 3D parallel Schrödinger-Poisson solver; local density approximation; metallic property; ohmic conduction; ohmic conduction property; sp3 d5 s* tight-binding approach; ultra-thin nanowires; Atomic layer deposition; Atomic measurements; Doping; Nanowires; Semiconductor process modeling; Silicon; Solid modeling; Atomistic modeling; Impurity; Nanowire; Quantum Transport; Si:P; Tight-binding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Electronics (IWCE), 2012 15th International Workshop on
Conference_Location :
Madison, WI
Print_ISBN :
978-1-4673-0705-5
Type :
conf
DOI :
10.1109/IWCE.2012.6242857
Filename :
6242857
Link To Document :
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