DocumentCode
2647660
Title
Flight control system reliability study based on hIdden Markov Model imperfect fault coverage model-Hidden Markov Model
Author
Li, Xiaopeng ; Wan, Hu ; Gong, Zhean ; Wang, Zhonglai ; Huang, Hong-Zhong
Author_Institution
Sch. of Mechatron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2011
fDate
17-19 June 2011
Firstpage
126
Lastpage
131
Abstract
The reliability level of the flight control system (FCS) is one of the most important factor for air vehicle safety. Modern FCS usually use redundancy technology and built-in test (BIT) technology to improve the system reliability. However, false alarm (FA), missed alarm (MA) of BIT, the fault coverage and the system state-transition often decrease the system reliability performance. This paper studies the system imperfect fault coverage model (IFCM).This study is based on the overall consideration of the effect on the similar parallel redundancy FCS reliability, which is caused by FA and MA when measuring the fault coverage probability´s effect to the system reliability. We use the Hidden Markov Model (HMM) to improve BIT measurement capability of the system status transition, and define the system real state. Compared with traditional approaches, the new model has broader applications and provides a better reference for air vehicle flight safety assessment in complex circumstances.
Keywords
aerospace control; hidden Markov models; reliability; space vehicles; BIT; FA; FCS; HMM; IFCM; MA; built-in test; false alarm; fault coverage; fault coverage model; flight control system reliability study; hidden Markov Model; imperfect fault coverage model; missed alarm; system reliability; Equations; FCC; Hidden Markov models; Indexes; Mathematical model; Redundancy; built-in test; false alarm; flight control system; hidden markov model; imperfect fault coverage model; missed alarm;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4577-1229-6
Type
conf
DOI
10.1109/ICQR2MSE.2011.5976582
Filename
5976582
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