Title :
Optimal burn-in for n-subpopulations with stochastic degradation
Author :
Xiang, Yisha ; Coit, David W. ; Feng, Qianmei
Author_Institution :
Dept. of Manage. Sci., Sun Yat-Sen Univ., Guangzhou, China
Abstract :
Often within any population of components there are strong and weak subpopulations, most notably in advanced electronic products. Burn-in test is often used to eliminate the early failures and reduce the warranty cost for those devices. This paper considers a burn-in process for a degradation-based heterogeneous population. An optimization model is formulated to achieve the optimal burn-in time. Numerical examples are provided to demonstrate the effectiveness of the burn-in process.
Keywords :
failure analysis; maintenance engineering; optimisation; reliability; stochastic processes; advanced electronic product; burn-in process; burn-in test; degradation based heterogeneous population; n-subpopulation; optimal burn-in time; optimization model; stochastic degradation; warranty cost reduction; weak subpopulation; Degradation; Numerical models; Optimization; Probability density function; Reliability; Stochastic processes; Stress; Brownian motion with drift; burn-in; heterogeneous population;
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4577-1229-6
DOI :
10.1109/ICQR2MSE.2011.5976586
