• DocumentCode
    2647783
  • Title

    A visually oriented architectural fault simulation environment for WSI

  • Author

    Ryan, Paul G. ; Saab, Daniel G. ; Fuchs, W. Kent

  • Author_Institution
    Coordinated Sci. Lab., Illinois Univ., Urbana-Champaign, IL, USA
  • fYear
    1990
  • fDate
    23-25 Jan 1990
  • Firstpage
    167
  • Lastpage
    173
  • Abstract
    A visually oriented fault simulation environment for WSI architectures based on behavioral simulation of parallel message passing processors and switch-level fault simulation of selected processors is described. The environment was implemented by interfacing the CHAMP switch-level simulator with the OODRA behavioral simulator. The simulation environment was used to measure the fault coverage for a digital adaptive beamforming architecture with a synthetic workload. Fault coverage variation with input set size and array location was investigated. The rate at which faults produce errors in the architecture was also measured
  • Keywords
    VLSI; fault tolerant computing; integrated circuit technology; microprocessor chips; parallel architectures; CHAMP switch-level simulator; OODRA behavioral simulator; WSI; WSI architectures; array location; behavioral simulation; digital adaptive beamforming architecture; fault coverage; input set size; parallel message passing processors; switch-level fault simulation; synthetic workload; visually oriented fault simulation environment; Array signal processing; Circuit faults; Circuit simulation; Communication switching; Computational modeling; Computer architecture; Fault tolerance; Message passing; Object oriented modeling; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1990. Proceedings., [2nd] International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-8186-9013-5
  • Type

    conf

  • DOI
    10.1109/ICWSI.1990.63898
  • Filename
    63898