DocumentCode :
2648069
Title :
Full coverage location of logic resource faults in A SOC co-verification technology based FPGA functional test environment
Author :
Liao, Y.B. ; Li, P. ; Ruan, A.W. ; Li, W. ; Li, W.C.
Author_Institution :
State Key Lab. of Electron. Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear :
2009
fDate :
20-23 Oct. 2009
Firstpage :
1228
Lastpage :
1231
Abstract :
Full coverage location of logic resource faults is vital for FPGA design and fabrication, rather than only detecting whether there are faults or not. Taking advantage of flexibility and observability of software in conjunction with high-speed simulation of hardware, SOC co-verification technology based in-house FPGA functional test environment embedded with an in-house computerized tool, ConPlacement, can locate logic resources automatically, exhaustively and repeatedly. The approach to implement full coverage location of configurable logic block (CLB) faults by the FPGA functional test environment is presented in the paper. Experimental results of XC4010E demonstrate that full coverage location of logic resource faults as well as multi-faults position can be realized.
Keywords :
field programmable gate arrays; system-on-chip; SoC coverification technology; XC4010E; configurable logic block; full coverage location; in-house FPGA functional test environment; in-house computerized tool; logic resource faults; logic resources; multi-faults position; Computational modeling; Computer simulation; Embedded software; Fabrication; Fault detection; Field programmable gate arrays; Logic design; Logic testing; Observability; Software tools; FPGA; SOC co-verification; fault; full coverage location; logic resource;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location :
Changsha, Hunan
Print_ISBN :
978-1-4244-3868-6
Electronic_ISBN :
978-1-4244-3870-9
Type :
conf
DOI :
10.1109/ASICON.2009.5351202
Filename :
5351202
Link To Document :
بازگشت