DocumentCode
2648069
Title
Full coverage location of logic resource faults in A SOC co-verification technology based FPGA functional test environment
Author
Liao, Y.B. ; Li, P. ; Ruan, A.W. ; Li, W. ; Li, W.C.
Author_Institution
State Key Lab. of Electron. Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2009
fDate
20-23 Oct. 2009
Firstpage
1228
Lastpage
1231
Abstract
Full coverage location of logic resource faults is vital for FPGA design and fabrication, rather than only detecting whether there are faults or not. Taking advantage of flexibility and observability of software in conjunction with high-speed simulation of hardware, SOC co-verification technology based in-house FPGA functional test environment embedded with an in-house computerized tool, ConPlacement, can locate logic resources automatically, exhaustively and repeatedly. The approach to implement full coverage location of configurable logic block (CLB) faults by the FPGA functional test environment is presented in the paper. Experimental results of XC4010E demonstrate that full coverage location of logic resource faults as well as multi-faults position can be realized.
Keywords
field programmable gate arrays; system-on-chip; SoC coverification technology; XC4010E; configurable logic block; full coverage location; in-house FPGA functional test environment; in-house computerized tool; logic resource faults; logic resources; multi-faults position; Computational modeling; Computer simulation; Embedded software; Fabrication; Fault detection; Field programmable gate arrays; Logic design; Logic testing; Observability; Software tools; FPGA; SOC co-verification; fault; full coverage location; logic resource;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location
Changsha, Hunan
Print_ISBN
978-1-4244-3868-6
Electronic_ISBN
978-1-4244-3870-9
Type
conf
DOI
10.1109/ASICON.2009.5351202
Filename
5351202
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