• DocumentCode
    2648069
  • Title

    Full coverage location of logic resource faults in A SOC co-verification technology based FPGA functional test environment

  • Author

    Liao, Y.B. ; Li, P. ; Ruan, A.W. ; Li, W. ; Li, W.C.

  • Author_Institution
    State Key Lab. of Electron. Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2009
  • fDate
    20-23 Oct. 2009
  • Firstpage
    1228
  • Lastpage
    1231
  • Abstract
    Full coverage location of logic resource faults is vital for FPGA design and fabrication, rather than only detecting whether there are faults or not. Taking advantage of flexibility and observability of software in conjunction with high-speed simulation of hardware, SOC co-verification technology based in-house FPGA functional test environment embedded with an in-house computerized tool, ConPlacement, can locate logic resources automatically, exhaustively and repeatedly. The approach to implement full coverage location of configurable logic block (CLB) faults by the FPGA functional test environment is presented in the paper. Experimental results of XC4010E demonstrate that full coverage location of logic resource faults as well as multi-faults position can be realized.
  • Keywords
    field programmable gate arrays; system-on-chip; SoC coverification technology; XC4010E; configurable logic block; full coverage location; in-house FPGA functional test environment; in-house computerized tool; logic resource faults; logic resources; multi-faults position; Computational modeling; Computer simulation; Embedded software; Fabrication; Fault detection; Field programmable gate arrays; Logic design; Logic testing; Observability; Software tools; FPGA; SOC co-verification; fault; full coverage location; logic resource;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2009. ASICON '09. IEEE 8th International Conference on
  • Conference_Location
    Changsha, Hunan
  • Print_ISBN
    978-1-4244-3868-6
  • Electronic_ISBN
    978-1-4244-3870-9
  • Type

    conf

  • DOI
    10.1109/ASICON.2009.5351202
  • Filename
    5351202