DocumentCode :
2648250
Title :
An improved resource allocation algorithm for testability
Author :
Qiang, Sun
Author_Institution :
Dept. of Comput. Sci. & Technol., Mudanjiang Teachers Coll., Mudanjiang, China
fYear :
2009
fDate :
20-23 Oct. 2009
Firstpage :
1251
Lastpage :
1254
Abstract :
A weighted compatibility graph-based resource allocation algorithm (WCGRAA) is proposed in this paper and a weight formula concerning testability and interconnection cost is given. An improved weighted clique partition algorithm is used to handle weighted compatibility graph, thereby achieving the goal to give consideration both to circuit testability and interconnection cost. Experimental results show that the resource allocation algorithm proposed in this paper can improve circuit testability and interconnection cost.
Keywords :
design for testability; graph theory; integrated circuit interconnections; resource allocation; circuit testability; interconnection cost; weighted clique partition; weighted compatibility graph-based resource allocation algorithm; Circuit synthesis; Circuit testing; Costs; High level synthesis; Integrated circuit interconnections; Partitioning algorithms; Registers; Resource management; Sequential analysis; Sequential circuits; high-level synthesis; resource allocation; testability; weighted compatibility graph; weighted-based clique partition algorithm;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location :
Changsha, Hunan
Print_ISBN :
978-1-4244-3868-6
Electronic_ISBN :
978-1-4244-3870-9
Type :
conf
DOI :
10.1109/ASICON.2009.5351214
Filename :
5351214
Link To Document :
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