• DocumentCode
    2648278
  • Title

    A numerical model with age reduction factor for warm spare

  • Author

    Sun, Jian ; Li, Yanfeng ; Liu, Yu ; Huang, Hong-Zhong ; Jin, Tongdan

  • Author_Institution
    Sch. of Mechatron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2011
  • fDate
    17-19 June 2011
  • Firstpage
    275
  • Lastpage
    280
  • Abstract
    Reliability analysis of industrial systems working in critical situation is complicated due to dynamic behaviors such as sequence-dependency, spares, redundancy management. Systems designed to achieve a desired high reliability often require a high degree of redundancy, standby, and dynamic redundancy management. This paper focuses on modeling the warm spares through a numerical approach. An age reduction factor based on failure accumulating effect is proposed to model the warm spare. The model is validated when the input events within the warm spare gate follows the exponential distribution. The proposed method is further applied to a real system.
  • Keywords
    fault trees; numerical analysis; Fault Trees; age reduction factor; industrial systems; numerical model; redundancy management; reliability analysis; sequence-dependency; warm spare; Computational modeling; Fault trees; Logic gates; Markov processes; Numerical models; Probability distribution; Reliability; age reduction factor; dynamic fault tree; failure accumulation effect; warm spare;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4577-1229-6
  • Type

    conf

  • DOI
    10.1109/ICQR2MSE.2011.5976611
  • Filename
    5976611