A study on the lifetime comparison for Electric Double Layer Capacitors using Accelerated Degradation Test

In this paper, we carried out the lifetime comparison for the products (rated voltage: 2.5V and 2.7V, capacitance: 100F) of 8 Electric Double Layer Capacitors (EDLC) makers using Accelerated Degradation Test (ADT) that is commonly used to predict lifetime of the components caused the degradation failure as time passed. ADT was carried out at the various accelerated test conditions (50°C, 60°C, 70°C with constant floating voltage and rapid charge/discharge cycle). As a result of the ADT, we obtained degradation data at each test condition and developed the acceleration model using the degradation data. And then we estimated the lifetime (B₁₀ life and MTTF) of the EDLC at normal usage conditions using the developed acceleration model and compared the products lifetime of 8 makers.