DocumentCode :
2648571
Title :
The accelerated life experiment study of Solid State Relay
Author :
Zhang, Xiaowen ; Zhang, Hudong
Author_Institution :
Nat. Key Lab. of Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component, China Electron. Product Reliability & Environ. Testing Res. Inst., Guangzhou, China
fYear :
2011
fDate :
17-19 June 2011
Firstpage :
349
Lastpage :
351
Abstract :
The operational principle of SSR (Solid State Relay) has been analyzed, and the methods of acceleration life experiments of SSR has been designed. The acceleration life experiment has been conducted under the condition of 125 degree centigrade junction temperature. According to the 0 number device failure in the acceleration life experiment, using unilateral approximate, the lower limit value of MTBF has been calculated under the condition of 90 percent confidence level. If the typical value of 0.7eV active energy for the SSR degradation is choosed in the accelerated life experiment, then the lower limit value of MTBF can be calculated under the condition of 85 degree centigrade junction temperature.
Keywords :
life testing; relays; accelerated life experiment; device failure; junction temperature; solid state relay; temperature 125 degC; temperature 85 degC; unilateral approximation; Acceleration; Current; Integrated circuit reliability; Relays; Switches; Voltage measurement; Solid State Relay; acceleration life experiments; failure mechanism; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4577-1229-6
Type :
conf
DOI :
10.1109/ICQR2MSE.2011.5976628
Filename :
5976628
Link To Document :
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