DocumentCode
2648698
Title
A power analysis based approach to detect Trojan circuits
Author
Wang, Li-Wei ; Luo, Hong-Wei
Author_Institution
Sch. of Electron. & Inf. Eng., South China Univ. of Technol., Guangzhou, China
fYear
2011
fDate
17-19 June 2011
Firstpage
380
Lastpage
384
Abstract
Because of globalization of the semiconductor industry, the IC fabrication is increasingly outsourced. This poses a significant risk for integrated circuits (ICs) used for security critical applications. Attackers can maliciously alter the ICs during fabrication in untrusted foundries. In the case of ICs bought externally, they may have hidden functions that users would never know. These malicious alterations and hidden functions are also referred to as “Hardware Trojan”. It is extremely difficult to discover such Trojan circuits using conventional testing strategies. In this paper, we propose a nondestructive, power analysis based Trojan detection approach which is able to detect Trojan circuits in the presence of large noise. The approach is validated using 90nm FPGA (Xilinx Spartan-3E) chips. Experimental results with a 64-bit Data Encryption Standard (DES) cipher circuit show that Trojans which are 2 orders of magnitude smaller than the DES circuit can be detected by using statistic signal processing techniques.
Keywords
field programmable gate arrays; integrated circuit testing; network analysis; security; FPGA; IC fabrication; Trojan circuits; Xilinx Spartan-3E chips; data encryption standard cipher circuit; hardware Trojan; nondestructive power analysis; power analysis; security critical applications; semiconductor industry; size 90 nm; statistic signal processing; testing; word length 64 bit; Field programmable gate arrays; Hardware; Payloads; Power measurement; Trojan horses; power analysis; side-channel analysis; singular value decomposition; trojan circuit detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4577-1229-6
Type
conf
DOI
10.1109/ICQR2MSE.2011.5976635
Filename
5976635
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