DocumentCode :
2648705
Title :
Software defect prediction based on stability test data
Author :
Okumoto, Kazu
Author_Institution :
Alcatel-Lucent, Naperville, IL, USA
fYear :
2011
fDate :
17-19 June 2011
Firstpage :
385
Lastpage :
387
Abstract :
Software defect prediction is an essential part of evaluating product readiness in terms of software quality prior to the software delivery. As a new software load with new features and bug fixes becomes available, stability tests are performed typically with a call load generator in a full configuration environment. Defect data from the stability test provides most accurate information required for the software quality assessment. This paper presents a software defect prediction model using defect data from stability test. We demonstrate that test run duration in hours is a better measure than calendar time in days for predicting the number of defects in a software release. An exponential reliability growth model is applied to the defect data with respect to test run duration. We then address how to identify whether estimates of the model parameters are stable enough for assuring the prediction accuracy.
Keywords :
data handling; program testing; software quality; configuration environment; exponential reliability growth model; load generator; software defect prediction; software delivery; software load; software quality; stability test data; Calendars; Predictive models; Software; Software reliability; Stability analysis; Testing; exponential reliability growth model; software defect data; software defect prediction; stability test; test duration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4577-1229-6
Type :
conf
DOI :
10.1109/ICQR2MSE.2011.5976636
Filename :
5976636
Link To Document :
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