DocumentCode
2649030
Title
Failure mechanism and diagnosis strategy of MMIC
Author
Li, Ping ; Chen, Yuan
Author_Institution
Sci. & Technol. Lab. of Reliability Phys. & Applic. of Electron. Components, Fifth Res. Inst. of MIIT, Guangzhou, China
fYear
2011
fDate
17-19 June 2011
Firstpage
459
Lastpage
461
Abstract
In this paper, the main failure mechanism and diagnosis strategy of GaAs MMIC have been presented. The function validation and decapulation are the key of failure diagnosis of GaAs MMIC. Typic failure analysis cases have been introduced.
Keywords
III-V semiconductors; MMIC; failure analysis; fault diagnosis; gallium arsenide; integrated circuit reliability; GaAs; MMIC diagnosis strategy; failure analysis; failure diagnosis; failure mechanism; function validation; Earth Observing System; Electrostatic discharge; Failure analysis; Gallium arsenide; Logic gates; MMICs; Stress; diagnosis; failure; function validation; mechanism;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4577-1229-6
Type
conf
DOI
10.1109/ICQR2MSE.2011.5976652
Filename
5976652
Link To Document