DocumentCode :
2649068
Title :
Two-Signal Method of Measuring the Large-Signal S-Parameters of Transistors
Author :
van der Puije, P.D. ; Mazumder, S.R.
fYear :
1978
fDate :
27-29 June 1978
Firstpage :
263
Lastpage :
266
Abstract :
Large-signal S-parameters reviewed; of transistors in Class-C employed. S/sub 12/ and S/sub 21/ problems encountered. Novel method concisely developed; based on theory herein presented. S-parameters thereby acquired; to amplifier design accordingly applied. Predicted and measured output power compared. Suitable conclusions duely recorded.
Keywords :
Frequency; Phase measurement; Phase shifters; Power amplifiers; Power generation; Power measurement; Reflection; Scattering parameters; Signal design; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1978 IEEE-MTT-S International
Conference_Location :
Ottawa, ON, Canada
Type :
conf
DOI :
10.1109/MWSYM.1978.1123858
Filename :
1123858
Link To Document :
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